2018
DOI: 10.3897/j.moem.4.2.33306 View full text |Buy / Rent full text
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Abstract: Citation: Bhatia D, Roy S, Nawaz S, Meena RS, Palkar VR (2018) Electrostatic force microscopy analysis of Bi 0.7 Dy 0.3 FeO 3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications. Modern Electronic Materials 4(2): 77-85. https://doi. AbstractIn this paper, we report the charge trapping phenomena in zinc oxide (n-ZnO) and Bi 0.7 Dy 0.3 FeO 3 (BDFO)/ZnO thin films deposited on p-type <100> conducting Si substrate. The significant chan… Show more

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